Researcher, Inventor & Author
SANDEEP K GOEL
Current Research Topics
Most of my research topics include some form of methodology development, prototype design and design-for-test. I have been working on solving the challenges of most advanced semiconductor process technology to enable faster yield ramp up as well as enabling 3D integration of heterogenous ICs. The current research topics include the following.
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Testing and diagnosis for yield learning chips in 10/7nm process
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3D Interposer and InFO stacking designs
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Design partitioning for wafer-on-wafer 3D stacks
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Monolithic 3D IC design
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System-level PPAC modeling using virtual platform
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Defect prediction in advanced nanometer process
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Benchmarking framework design and analysis
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Statistical diagnosis analysis and diagnosability prediction for improved PFA hit rate